[U-Boot] [PATCH V4 03/10] dm: test: Add tests for device's uclass platform data

[Simon Glass]

On 15 April 2015 at 05:07, Przemyslaw Marczak <p.marczak at samsung.com> wrote:
> This test introduces new test structure type:dm_test_perdev_uc_pdata.
> The structure consists of three int values only. For the test purposes,
> three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.
>
> This commit adds two test cases for uclass platform data:
> - Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
>   * uclass driver sets: .per_device_platdata_auto_alloc_size field
>   * the devices's: dev->uclass_platdata is non-NULL
>
> - Test: dm_test_autobind_uclass_pdata_valid - this tests:
>   * if the devices's: dev->uclass_platdata is non-NULL
>   * the structure of type 'dm_test_perdev_uc_pdata' allocated at address
>     pointed by dev->uclass_platdata. Each structure field, should be equal
>     to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.
>
> Signed-off-by: Przemyslaw Marczak <p.marczak at samsung.com>
> Cc: Simon Glass <sjg at chromium.org>
> Acked-by: Simon Glass <sjg at chromium.org>
> ---
> Changes V2:
> - update test functions with calls: uclass_find_first/next_device()
>
> Changes V3:
> - none
>
> Changes V4:
> - add Acked-by

Applied to u-boot-dm, thanks!