[U-Boot] [PATCH 109/172] ddr: altera: Zap rw_mgr_mem_calibrate_read_test_patterns_all_ranks()

[Marek Vasut]

This function is called from one single place and it's sole purpose
is to call one single function with slightly modified arguments.
Zap this function to skip this useless intermediate step.

Signed-off-by: Marek Vasut <marex at denx.de>
---
 drivers/ddr/altera/sequencer.c | 11 ++---------
 1 file changed, 2 insertions(+), 9 deletions(-)

diff --git a/drivers/ddr/altera/sequencer.c b/drivers/ddr/altera/sequencer.c
index a4cba69..e17e601 100644
--- a/drivers/ddr/altera/sequencer.c
+++ b/drivers/ddr/altera/sequencer.c
@@ -1107,13 +1107,6 @@ static uint32_t rw_mgr_mem_calibrate_read_test_patterns(uint32_t rank_bgn,
 	return *bit_chk == param->read_correct_mask;
 }
 
-static uint32_t rw_mgr_mem_calibrate_read_test_patterns_all_ranks
-	(uint32_t group, uint32_t num_tries, uint32_t *bit_chk)
-{
-	return rw_mgr_mem_calibrate_read_test_patterns(0, group,
-		num_tries, bit_chk, 1);
-}
-
 /**
  * rw_mgr_mem_calibrate_read_load_patterns() - Load up the patterns for read test
  * @rank_bgn:	Rank number
@@ -2230,8 +2223,8 @@ static int rw_mgr_mem_calibrate_guaranteed_write(const u32 rw_group,
 	 * Altera EMI_RM 2015.05.04 :: Figure 1-26
 	 * Back-to-Back reads of the patterns used for calibration.
 	 */
-	ret = rw_mgr_mem_calibrate_read_test_patterns_all_ranks(rw_group, 1,
-								&bit_chk);
+	ret = rw_mgr_mem_calibrate_read_test_patterns(0, rw_group, 1,
+						      &bit_chk, 1);
 	if (!ret) {	/* FIXME: 0 means failure in this old code :-( */
 		debug_cond(DLEVEL == 1,
 			   "%s:%d Guaranteed read test failed: g=%u p=%u\n",
-- 
2.1.4