[U-Boot] [PATCH v3 10/11] clk: test: Provide unit test for clk_get_parent_rate() method

[Lukasz Majewski]

This commit provides sandbox unit test for clk_get_parent_rate() method.

For testing the default test clocks setup had to be adjusted to emulate
structure similar to clocks in the Common Clock Framework [CCF]
(for iMX devices).

The clk_get_parent_rate() relies on dev->driver_data having the pointer
to proper struct clk.
It uses internally clk_get_parent() method also tested by this test.

Signed-off-by: Lukasz Majewski <lukma at denx.de>

---

Changes in v3:
- New patch

 arch/sandbox/include/asm/clk.h |  8 ++++++++
 drivers/clk/clk_sandbox_test.c | 26 ++++++++++++++++++++++++++
 test/dm/clk.c                  |  1 +
 3 files changed, 35 insertions(+)

diff --git a/arch/sandbox/include/asm/clk.h b/arch/sandbox/include/asm/clk.h
index 90f925109f..1df9534236 100644
--- a/arch/sandbox/include/asm/clk.h
+++ b/arch/sandbox/include/asm/clk.h
@@ -79,6 +79,14 @@ int sandbox_clk_test_get_by_id(struct udevice *dev);
  */
 int sandbox_clk_test_get_bulk(struct udevice *dev);
 /**
+ * sandbox_clk_test_get_parent_rate - Ask the sandbox clock test device to
+ * query a passed clock's parent rate.
+ *
+ * @dev:	The sandbox clock test (client) devivce.
+ * @return:	The rate of the clock
+ */
+ulong sandbox_clk_test_get_parent_rate(struct udevice *dev);
+/**
  * sandbox_clk_test_get_rate - Ask the sandbox clock test device to query a
  * clock's rate.
  *
diff --git a/drivers/clk/clk_sandbox_test.c b/drivers/clk/clk_sandbox_test.c
index 4d276f55b9..8ea15614c1 100644
--- a/drivers/clk/clk_sandbox_test.c
+++ b/drivers/clk/clk_sandbox_test.c
@@ -64,6 +64,32 @@ int sandbox_clk_test_get_bulk(struct udevice *dev)
 	return clk_get_bulk(dev, &sbct->bulk);
 }
 
+ulong sandbox_clk_test_get_parent_rate(struct udevice *dev)
+{
+	struct sandbox_clk_test *sbct = dev_get_priv(dev);
+	struct clk *i2c_clk, *parent_clk;
+	struct udevice *parent_bkp;
+	ulong rate;
+
+	parent_clk = &sbct->clks[SANDBOX_CLK_TEST_ID_FIXED];
+	i2c_clk = &sbct->clks[SANDBOX_CLK_TEST_ID_I2C];
+
+	parent_clk->dev->driver_data = (ulong)parent_clk;
+	parent_bkp = i2c_clk->dev->parent;
+	i2c_clk->dev->parent = parent_clk->dev;
+
+	rate = clk_get_parent_rate(i2c_clk);
+
+	i2c_clk->dev->parent = parent_bkp;
+	parent_clk->dev->driver_data = 0;
+
+	/* Check if cache'd value is correct */
+	if (parent_clk->rate != 1234)
+		return 0;
+
+	return rate;
+}
+
 ulong sandbox_clk_test_get_rate(struct udevice *dev, int id)
 {
 	struct sandbox_clk_test *sbct = dev_get_priv(dev);
diff --git a/test/dm/clk.c b/test/dm/clk.c
index 8b858cee01..94f475bd8e 100644
--- a/test/dm/clk.c
+++ b/test/dm/clk.c
@@ -100,6 +100,7 @@ static int dm_test_clk(struct unit_test_state *uts)
 	ut_asserteq(0, sandbox_clk_query_enable(dev_clk, SANDBOX_CLK_ID_I2C));
 
 	ut_asserteq(0, sandbox_clk_test_get_by_id(dev_test));
+	ut_asserteq(1234, sandbox_clk_test_get_parent_rate(dev_test));
 
 	ut_assertok(sandbox_clk_test_free(dev_test));
 	return 0;
-- 
2.11.0