[PATCH v5 4/4] test: dm: tee: extend with RPC test

Igor Opaniuk igor.opaniuk at gmail.com
Wed Jan 20 18:55:30 CET 2021


From: Igor Opaniuk <igor.opaniuk at foundries.io>

Extend existing DM tee tests adding test coverage for reverse RPC calls.
Currently this commit only adds tests for I2C requests from TEE driver
to TEE supplicant, for instance reading/writing data to emulated i2c
eeprom defines in standard sandbox test device tree
(arch/sandbox/dts/test.dtb):

=> i2c bus
Bus 0:	i2c at 0  (active 0)
   2c: eeprom at 2c, offset len 1, flags 0
   ...

Running TEE tests:
=> ut dm tee
Test: dm_test_tee: tee.c
Test: dm_test_tee: tee.c (flat tree)
Failures: 0

Signed-off-by: Igor Opaniuk <igor.opaniuk at foundries.io>
Reviewed-by: Simon Glass <sjg at chromium.org>

---

(no changes since v1)

 test/dm/tee.c | 107 +++++++++++++++++++++++++++++++++++++++++++++++---
 1 file changed, 102 insertions(+), 5 deletions(-)

diff --git a/test/dm/tee.c b/test/dm/tee.c
index ddbdcfb0cf..51ffb4e4a9 100644
--- a/test/dm/tee.c
+++ b/test/dm/tee.c
@@ -13,11 +13,12 @@
 #include <test/test.h>
 #include <test/ut.h>
 #include <tee/optee_ta_avb.h>
+#include <tee/optee_ta_rpc_test.h>
 
-static int open_session(struct udevice *dev, u32 *session)
+static int open_session(struct udevice *dev, u32 *session,
+			struct tee_optee_ta_uuid uuid)
 {
 	struct tee_open_session_arg arg;
-	const struct tee_optee_ta_uuid uuid = TA_AVB_UUID;
 	int rc;
 
 	memset(&arg, 0, sizeof(arg));
@@ -32,7 +33,7 @@ static int open_session(struct udevice *dev, u32 *session)
 	return 0;
 }
 
-static int invoke_func(struct udevice *dev, u32 session)
+static int invoke_func_avb(struct udevice *dev, u32 session)
 {
 	struct tee_param param = { .attr = TEE_PARAM_ATTR_TYPE_VALUE_OUTPUT };
 	struct tee_invoke_arg arg;
@@ -47,6 +48,47 @@ static int invoke_func(struct udevice *dev, u32 session)
 	return 0;
 }
 
+static int invoke_func_rpc_test(struct udevice *dev, u32 session,
+				u64 op, u64 busnum, u64 chip_addr,
+				u8 *buf, size_t buf_size)
+{
+	struct tee_param param[2];
+	struct tee_invoke_arg arg;
+	struct tee_shm *shm_buf;
+	int rc;
+
+	memset(&arg, 0, sizeof(arg));
+	arg.session = session;
+	arg.func = op;
+
+	rc = tee_shm_alloc(dev, buf_size,
+			   TEE_SHM_ALLOC, &shm_buf);
+	if (rc)
+		return rc;
+
+	if (op == TA_RPC_TEST_CMD_I2C_WRITE)
+		memcpy(shm_buf->addr, buf, buf_size);
+
+	memset(param, 0, sizeof(param));
+	param[0].attr = TEE_PARAM_ATTR_TYPE_VALUE_INPUT;
+	param[0].u.value.a = busnum;
+	param[0].u.value.b = chip_addr;
+	param[1].attr = TEE_PARAM_ATTR_TYPE_MEMREF_INOUT;
+	param[1].u.memref.shm = shm_buf;
+	param[1].u.memref.size = buf_size;
+
+	if (tee_invoke_func(dev, &arg, 2, param) || arg.ret) {
+		goto out;
+		rc = -1;
+	}
+
+	if (op == TA_RPC_TEST_CMD_I2C_READ)
+		memcpy(buf, shm_buf->addr, buf_size);
+out:
+	tee_shm_free(shm_buf);
+	return rc;
+}
+
 static int match(struct tee_version_data *vers, const void *data)
 {
 	return vers->gen_caps & TEE_GEN_CAP_GP;
@@ -62,6 +104,7 @@ static int test_tee(struct unit_test_state *uts, struct test_tee_vars *vars)
 	struct tee_version_data vers;
 	struct udevice *dev;
 	struct sandbox_tee_state *state;
+	struct tee_optee_ta_uuid avb_uuid = TA_AVB_UUID;
 	u32 session = 0;
 	int rc;
 	u8 data[128];
@@ -71,11 +114,11 @@ static int test_tee(struct unit_test_state *uts, struct test_tee_vars *vars)
 	state = dev_get_priv(dev);
 	ut_assert(!state->session);
 
-	rc = open_session(dev, &session);
+	rc = open_session(dev, &session, avb_uuid);
 	ut_assert(!rc);
 	ut_assert(session == state->session);
 
-	rc = invoke_func(dev, session);
+	rc = invoke_func_avb(dev, session);
 	ut_assert(!rc);
 
 	rc = tee_close_session(dev, session);
@@ -103,11 +146,65 @@ static int test_tee(struct unit_test_state *uts, struct test_tee_vars *vars)
 	return 0;
 }
 
+#define I2C_BUF_SIZE 64
+
+static int test_tee_rpc(struct unit_test_state *uts)
+{
+	struct tee_version_data vers;
+	struct udevice *dev;
+	struct sandbox_tee_state *state;
+	struct tee_optee_ta_uuid rpc_test_uuid = TA_RPC_TEST_UUID;
+	u32 session = 0;
+	int rc;
+
+	char *test_str = "Test string";
+	u8 data[I2C_BUF_SIZE] = {0};
+	u8 data_from_eeprom[I2C_BUF_SIZE] = {0};
+
+	/* Use sandbox I2C EEPROM emulation; bus: 0, chip: 0x2c */
+	u64 bus = 0;
+	u64 chip = 0x2c;
+
+	dev = tee_find_device(NULL, match, NULL, &vers);
+	ut_assert(dev);
+	state = dev_get_priv(dev);
+	ut_assert(!state->session);
+
+	/* Test RPC call asking for I2C sevice */
+	rc = open_session(dev, &session, rpc_test_uuid);
+	ut_assert(!rc);
+	ut_assert(session == state->session);
+
+	/* Write buffer */
+	strncpy((char *)data, test_str, strlen(test_str));
+	rc = invoke_func_rpc_test(dev, session, TA_RPC_TEST_CMD_I2C_WRITE,
+				  bus, chip, data, sizeof(data));
+	ut_assert(!rc);
+
+	/* Read buffer */
+	rc = invoke_func_rpc_test(dev, session, TA_RPC_TEST_CMD_I2C_READ,
+				  bus, chip, data_from_eeprom,
+				  sizeof(data_from_eeprom));
+	ut_assert(!rc);
+
+	/* Compare */
+	ut_assert(!memcmp(data, data_from_eeprom, sizeof(data)));
+
+	rc = tee_close_session(dev, session);
+	ut_assert(!rc);
+	ut_assert(!state->session);
+
+	return 0;
+}
+
 static int dm_test_tee(struct unit_test_state *uts)
 {
 	struct test_tee_vars vars = { NULL, NULL };
 	int rc = test_tee(uts, &vars);
 
+	if (IS_ENABLED(CONFIG_OPTEE_TA_RPC_TEST))
+		rc = test_tee_rpc(uts);
+
 	/* In case test_tee() asserts these may still remain allocated */
 	tee_shm_free(vars.reg_shm);
 	tee_shm_free(vars.alloc_shm);
-- 
2.25.1



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