[RFC 6/6] test: dm: add SCMI pinctrl test
Simon Glass
sjg at chromium.org
Fri Sep 22 20:27:26 CEST 2023
Hi,
On Sun, 10 Sept 2023 at 23:47, AKASHI Takahiro
<takahiro.akashi at linaro.org> wrote:
>
> On Sun, Sep 10, 2023 at 01:13:30PM -0600, Simon Glass wrote:
> > Hi AKASHI,
> >
> > On Tue, 5 Sept 2023 at 20:41, AKASHI Takahiro
> > <takahiro.akashi at linaro.org> wrote:
> > >
> > > In this test, SCMI-based pinmux feature is exercised.
> > >
> > > Signed-off-by: AKASHI Takahiro <takahiro.akashi at linaro.org>
> > > ---
> > > test/dm/scmi.c | 62 ++++++++++++++++++++++++++++++++++++++++++++++++++
> > > 1 file changed, 62 insertions(+)
> > >
> > > diff --git a/test/dm/scmi.c b/test/dm/scmi.c
> > > index 423b6ef70b29..ca5a2e9c781e 100644
> > > --- a/test/dm/scmi.c
> > > +++ b/test/dm/scmi.c
> > > @@ -21,6 +21,7 @@
> > > #include <scmi_protocols.h>
> > > #include <asm/scmi_test.h>
> > > #include <dm/device-internal.h>
> > > +#include <dm/pinctrl.h>
> > > #include <dm/test.h>
> > > #include <linux/kconfig.h>
> > > #include <power/regulator.h>
> > > @@ -395,3 +396,64 @@ static int dm_test_scmi_voltage_domains(struct unit_test_state *uts)
> > > return release_sandbox_scmi_test_devices(uts, dev);
> > > }
> > > DM_TEST(dm_test_scmi_voltage_domains, UT_TESTF_SCAN_FDT);
> > > +
> > > +/*
> > > + * This part is derived from test/dm/pinmux.c, So
> > > + *
> > > + * Copyright (C) 2020 Sean Anderson <seanga2 at gmail.com>
> > > + */
> > > +
> > > +static char buf[64];
> > > +#define test_muxing(selector, expected) do { \
> > > + ut_assertok(pinctrl_get_pin_muxing(dev, selector, buf, sizeof(buf))); \
> > > + ut_asserteq_str(expected, (char *)&buf); \
> >
> > Can you instead make this a function?
>
> Sure, but please note that the whole scheme was borrowed
> from test/dm/pinmux.c.
I'm not sure if it is needed there, either. It is pretty ugly.
>
> > > +} while (0)
> > > +
> > > +#define test_name(selector, expected) do { \
> > > + ut_assertok(pinctrl_get_pin_name(dev, selector, buf, sizeof(buf))); \
> > > + ut_asserteq_str(expected, (char *)&buf); \
> > > +} while (0)
> > > +
> > > +static int dm_test_scmi_pinmux(struct unit_test_state *uts)
> > > +{
> > > + struct udevice *dev;
> > > +
> > > + ut_assertok(uclass_get_device_by_name(UCLASS_PINCTRL, "protocol at 19",
> > > + &dev));
> > > + ut_assertok(pinctrl_select_state(dev, "default"));
> > > + test_muxing(0, "<unknown>");
> >
> > ut_assertok(check_muxing(uts, ...));
>
> Assertion for
>
> > > + test_muxing(1, "<unknown>");
> > > + test_muxing(2, "I2S.");
> > > + test_muxing(3, "I2S.");
> > > + test_muxing(4, "I2S.");
> > > + test_muxing(5, "GPIO bias-pull-up.");
> > > + test_muxing(6, "GPIO drive-open-drain output-mode output-value.");
> > > + test_muxing(7, "GPIO bias-pull-down input-mode.");
> > > + test_muxing(8, "GPIO bias-disable.");
>
> this chunk of code?
> It is not clear to me what is the advantage, though.
Avoiding macros, which are not needed.
>
> -Takahiro Akashi
>
> > > +
> > > + ut_assertok(pinctrl_select_state(dev, "alternate"));
> > > + test_muxing(0, "I2C drive-open-drain.");
> > > + test_muxing(1, "I2C drive-open-drain.");
> > > + test_muxing(2, "SPI.");
> > > + test_muxing(3, "SPI.");
> > > + test_muxing(4, "SPI.");
> > > + test_muxing(5, "CS bias-pull-up.");
> > > + test_muxing(6, "CS drive-open-drain output-mode output-value.");
> > > + test_muxing(7, "GPIO bias-pull-down input-mode.");
> > > + test_muxing(8, "GPIO bias-disable.");
> > > +
> > > + ut_assertok(pinctrl_select_state(dev, "0"));
> > > + test_muxing(0, "I2C drive-open-drain.");
> > > + test_muxing(1, "I2C drive-open-drain.");
> > > + test_muxing(2, "I2S.");
> > > + test_muxing(3, "I2S.");
> > > + test_muxing(4, "I2S.");
> > > + test_muxing(5, "GPIO bias-pull-up.");
> > > + test_muxing(6, "GPIO drive-open-drain output-mode output-value.");
> > > + test_muxing(7, "GPIO bias-pull-down input-mode.");
> > > + test_muxing(8, "GPIO bias-disable.");
> > > +
> > > + return 0;
> > > +}
> > > +
> > > +DM_TEST(dm_test_scmi_pinmux, UT_TESTF_SCAN_FDT);
> > > --
> > > 2.34.1
> > >
> >
> > Regards,
> > Simon
Regards,
Simon
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